[nanoPost] Surface analysis

Company UK

SME based in the UK and Europe’s leading surface analysis business.  We have over 25 years of surface analysis research and development experience and work extensively on cleaning validation and surface physico-chemical characterisation both before and after cleaning in a variety of industries.

Physico-chemical characterisation of surfaces at the nano and sub-nano level using advanced X-ray Photoelectron Spectroscopy (XPS) Time-of-Flight Secondary Ion Mass Spectrometry (ToFSIMS) Dynamic Secondary Ion Spectrometry (DSIMS) and 3D non-contact profilometry. 

All these techniques monitor surfaces at the nano and sub nano range with sensitivities in the ppb-ppm region.
They allow characterisation of both chemical state and molecular species in the top few nanometres of the surface and can also be used to depth profile sub-surfaces to several microns.

Nanometric surface roughness can be imaged using profilometry without contacting the surface. Chemical and  molecular species imaging can also be achieved with both the XPS and SIMS techniques.

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